文章

• Lineup of Modern Clamping Systems for Tests of Power Semiconductor Devices with Force up to 150 kN

  8 September 2020

  This article describes the steps of development and research carried out to design a clamping system for disc semiconductors and analyzes the encountered issues. A number of technical solutions were used to improve ergonomics, later proving their efficiency in real operation.

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• A Next-generation Surge Current Tester

  11 August 2020

          The article presents a unique surge current tester rated for 120kA, describes an innovative approach to forming the current based on MOSFETs and details the key features of its power section and the clamping device.

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  11 February 2020

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